Microscopic methods

Microscopic methods allow the evaluation and characterization of material structures, surface defects, inhomogeneities or contaminations. Different methods are used depending on the problem and the desired magnification range.

We offer:

With our stereomicroscope magnifications of up to 100x are possible. This gives you an overview of the shape, crystalline properties, dimensions and optical properties (colour, etc.) of materials and surfaces. The investigated areas are digitally mapped by us and transmitted to you.

The scanning electron microscope can be used in combination with X-ray microanalysis in a wide variety of applications:

  • REM images: SE (secondary electron contrast) images for surface topography and BSE (backscatter electron contrast) images for material contrast); magnifications 20 to 50000 times (limit resolution < 10 nm)
  • Energy dispersive (EDX) or wavelength dispersive (WDX) X-ray fluorescence analysis at defined points (microanalysis)
  • Element distribution via mapping or line scan
  • Particle size determination by measuring particles
  • Damage & claims case analyses: By combining the various procedures, specks, residues, inclusions or deposits can be analysed and clarified.

Similar to X-ray microanalysis, we can use infrared microscopy to analyze certain defined areas / points of a (mostly organic, partly also inorganic) sample. This enables us, for example, to gain insights into the molecular composition of an impurity.

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